Importance Sampling of the Micrograin Visible NDF
dc.contributor.author | Lucas, Simon | en_US |
dc.contributor.author | Pacanowski, Romain | en_US |
dc.contributor.author | Barla, Pascal | en_US |
dc.contributor.editor | Wang, Beibei | en_US |
dc.contributor.editor | Wilkie, Alexander | en_US |
dc.date.accessioned | 2025-06-20T07:54:18Z | |
dc.date.available | 2025-06-20T07:54:18Z | |
dc.date.issued | 2025 | |
dc.description.abstract | Importance sampling of visible normal distribution functions (vNDF) is a required ingredient for the efficient rendering of microfacet-based materials. In this paper, we explain how to sample the vNDF for the micrograin material model [LRPB23], which has been recently improved to handle height-normal correlations through a new Geometric Attenuation Factor (GAF) [LRPB24], leading to a stronger impact on appearance compared to the earlier Smith approximation. To this end, we make two contributions: we derive analytic expressions for the marginal and conditional cumulative distribution functions (CDFs) of the vNDF; we provide efficient methods for inverting these CDFs based respectively on a 2D lookup table and on the triangle-cut method [Hei20]. | en_US |
dc.description.number | 4 | |
dc.description.sectionheaders | Sampling and Guiding | |
dc.description.seriesinformation | Computer Graphics Forum | |
dc.description.volume | 44 | |
dc.identifier.doi | 10.1111/cgf.70174 | |
dc.identifier.issn | 1467-8659 | |
dc.identifier.pages | 10 pages | |
dc.identifier.uri | https://doi.org/10.1111/cgf.70174 | |
dc.identifier.uri | https://diglib.eg.org/handle/10.1111/cgf70174 | |
dc.publisher | The Eurographics Association and John Wiley & Sons Ltd. | en_US |
dc.rights | Attribution 4.0 International License | |
dc.rights.uri | https://creativecommons.org/licenses/by/4.0/ | |
dc.subject | CCS Concepts: Computing methodologies → Reflectance modeling | |
dc.subject | Computing methodologies → Reflectance modeling | |
dc.title | Importance Sampling of the Micrograin Visible NDF | en_US |