44-Issue 4
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Browsing 44-Issue 4 by Subject "CCS Concepts: Computing methodologies → Reflectance modeling"
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Item Importance Sampling of the Micrograin Visible NDF(The Eurographics Association and John Wiley & Sons Ltd., 2025) Lucas, Simon; Pacanowski, Romain; Barla, Pascal; Wang, Beibei; Wilkie, AlexanderImportance sampling of visible normal distribution functions (vNDF) is a required ingredient for the efficient rendering of microfacet-based materials. In this paper, we explain how to sample the vNDF for the micrograin material model [LRPB23], which has been recently improved to handle height-normal correlations through a new Geometric Attenuation Factor (GAF) [LRPB24], leading to a stronger impact on appearance compared to the earlier Smith approximation. To this end, we make two contributions: we derive analytic expressions for the marginal and conditional cumulative distribution functions (CDFs) of the vNDF; we provide efficient methods for inverting these CDFs based respectively on a 2D lookup table and on the triangle-cut method [Hei20].